Speaker
Prof.
Young-chul Ghim
(Korea Advanced Institute of Science and Technology)
Description
Reliabilities of electron temperature measurements based on Thomson scattering (TS) systems depend on transmittance of the optical band-pass filters in polychromators. We investigate the system performance as a function of electron temperature to determine reliable range of measurements. To achieve the objective, we build a forward model of the KSTAR TS system, and generate synthetic TS data with the prescribed electron temperature and density profiles. The prescribed profiles are compared with the estimated ones to evaluated the system performance.
Primary author
Mr
Keon Hee Kim
(Korea Advanced Institute of Science and Technology)
Co-authors
Dr
Jongha Lee
(National Fusion Research Institute)
Mr
Kyeo-Reh Park
(Korea Advanced Institute of Science and Technology)
Mr
Tae-suk Oh
(Korea Advanced Institute of Science and Technology)
Prof.
Young-chul Ghim
(Korea Advanced Institute of Science and Technology)
