Sep 24 – 28, 2017
Europe/Prague timezone

Forward scattering measurements by terahertz solid state source interferometer on KTX reversed field pinch

Sep 27, 2017, 3:30 PM
2m
POSTER High-temperature plasmas Poster Session #2 Introduction

Speaker

Dr Wenzhe Mao (University of Science and Technology of China)

Description

A one chord microwave interferometer has been applied to measure forward scattering from electron density fluctuations on KTX reversed field pinch. Two terahertz microwave souces are used to form a heterodyne interferometer system. Frequency of the diagnostic beam is about 650 GHz and the power of each source is about 2 mw. The diagnostic beam goes vertically through the center of the plasma, and the scattering beam are also collected by the sensitive Schottky planar diode mixer. The forward scattering measurement provide more sensitive fluctuation diagnostic than interferometer signal. The spectrum of electron density fluctuation in different operation mode on KTX has been compared and analyzed using this kind of method.

Primary author

Dr Wenzhe Mao (University of Science and Technology of China)

Co-author

Dr Jinlin Xie (University of Science and Technology of China)

Presentation materials